NanoScan 2s Si/3.5/1.8 Slit-Scanning Beam Profiler
Price:Negotiable
Contact Info
- Add:深圳市福田区福田街道岗厦社区彩田南路3002号彩虹新都彩虹大厦6F-08, Zip:
- Contact: 罗先生
- Tel:18476359520
- Email:1993029171@qq.com
Other Products
Description
Additional Information
The NanoScan slit scanning beam profiler accurately captures and analyzes wavelengths from 190nm to 1100nm through its silicon detector. This analyzer includes features such as slit sizes suitable for small beams, near real-time data capture rates, optional power measurement capabilities, and operates in continuous or kHz pulsed modes, making it highly suitable for comprehensive analysis of UV, VIS, and NIR lasers.
Beam size from 7μm to ~2.3mm
Power level range from ~10nW to ~10W
USB 2.0 interface
Includes NanoScan Standard or Professional software
| Industry Category | Measurement-Analysis-Instruments |
|---|---|
| Product Category | |
| Brand: | Ophir |
| Spec: | NanoScan 2s Si/3.5/1.8 |
| Stock: | 100 |
| Manufacturer: | |
| Origin: | China / Guangdong / Shenshi |
